Title :
Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization
Author :
Natarajan, Vivek ; Banerjee, Adrish ; Sen, Satyaki ; Devarakond, Shyam ; Chatterjee, Avhishek
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper proposes a fast and low-cost method of calibrating RF transceiver systems using on-chip DSP resources and some additional circuit control points. Experimental results on a commercial power amplifier demonstrate significant increases in production yields using the proposed approach.
Keywords :
calibration; digital signal processing chips; integrated circuit yield; optimisation; power amplifiers; radio transceivers; RF transceiver systems; additional circuit control points; calibration; commercial power amplifier; iterative tuning-driven power-conscious; on-chip DSP resources; performance optimization; production yields; yield recovery; Costs; Digital signal processing; Integrated circuit modeling; Mixed analog digital integrated circuits; Optimization; Production facilities; Radio frequency; Receivers; System-on-chip; Transmitters;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2014.2361716
