Title :
A Procedure for Alternate Test Feature Design and Selection
Author :
Barragan, Manuel J. ; Leger, Gildas
Abstract :
This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
Keywords :
integrated circuit design; integrated circuit testing; low noise amplifiers; radiofrequency integrated circuits; RF LNA circuit; alternate test feature design; design accuracy; Analog circuits; Computational modeling; Envelope detectors; Machine learning algorithms; Mixed analog digital integrated circuits; Monte Carlo methods; Predictive models; Radio frequency; System-on-chip; Alternate Test; feature design; feature selection; machine learning;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2014.2361722
