DocumentCode :
1762054
Title :
Accurate Characterization of Both Thin and Thick Magnetic Films Using a Shorted Microstrip
Author :
Lepetit, Thomas ; Neige, Julien ; Adenot-Engelvin, Anne-Lise ; Ledieu, Marc
Author_Institution :
CEA-DAM Le Ripault, Monts, France
Volume :
50
Issue :
9
fYear :
2014
fDate :
Sept. 2014
Firstpage :
1
Lastpage :
10
Abstract :
We report an improvement on a single coil technique allowing the measurement up to 6 GHz of the permeability of magnetic films, both thin and thick. The permeability is deduced from two impedance measurements, with and without a saturating magnetic field. An equivalent electrical circuit model is used to retrieve the impedance solely due to the film from the measured one. The improvement discussed in this paper is obtained by considering a single coil as a shorted microstrip and proceeding to a transmission line analysis. From it, we obtain an expression for the scaling coefficient (SC) common to thin film techniques. We prove its consistency by comparing it favorably with SCs determined from a thin film reference sample. Our technique is therefore no longer restricted by the choice of reference samples. We illustrate this by measuring magnetic films hundreds of micrometers thick and comparing the results with a coaxial line measurement.
Keywords :
equivalent circuits; magnetic permeability; magnetic thin films; transmission line theory; coaxial line measurement; equivalent electrical circuit model; impedance measurements; magnetic film permeability; saturating magnetic field; scaling coefficient; shorted microstrip; single coil technique; thick magnetic film; thin magnetic film; transmission line analysis; Calibration; Films; Impedance; Mathematical model; Microstrip; Permeability; Transmission line measurements; Electromagnetic interference (EMI); microstrip; microwave; permeability; thin films;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2014.2318022
Filename :
6807802
Link To Document :
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