• DocumentCode
    1762118
  • Title

    In Situ Power Gating Efficiency Learner for Fine-Grained Self-Adaptive Power Gating

  • Author

    Trivedi, Amit Ranjan ; Wen Yueh ; Mukhopadhyay, Saibal

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    41760
  • Firstpage
    344
  • Lastpage
    348
  • Abstract
    A low-power in situ learner circuit is presented to characterize the tradeoff between leakage saving and transition energy overhead in power gating (PG). A self-adaptive PG scheme is demonstrated that utilizes the learner circuit to adaptively invoke PG only when leakage saving is more than the transition energy overhead. A 130-nm test chip demonstrates functionality of the learner circuit and its application to adaptive PG under varying process, temperature, and idle signal pattern.
  • Keywords
    integrated circuit testing; low-power electronics; PG scheme; fine-grained self-adaptive power gating; idle signal pattern; leakage saving; low-power in situ learner circuit; power gating efficiency learner; size 130 nm; temperature; transition energy overhead; varying process; Heating; Logic gates; Noise; Power measurement; Temperature measurement; Temperature sensors; Transistors; Adaptation; online test circuit; power gating (PG);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Express Briefs, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-7747
  • Type

    jour

  • DOI
    10.1109/TCSII.2014.2312635
  • Filename
    6807809