Title :
Fuse-Based Field-Dispensable ESD Protection for Ultra-High-Speed ICs
Author :
Chen Zhang ; Zongyu Dong ; Fei Lu ; Rui Ma ; Li Wang ; Hui Zhao ; Xin Wang ; Xiao Wang ; He Tang ; Wang, Aiping
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, Riverside, CA, USA
Abstract :
We report the first fuse-based field-dispensable electrostatic discharging (ESD) protection structure to eliminate the ESD-induced parasitics, hence, enable ultrahigh-speed ICs with robust ESD protection. Silicon results validate the new ESD protection concept for more than 20 Gb/s ICs in a 28-nm CMOS.
Keywords :
CMOS integrated circuits; electric fuses; electrostatic discharge; high-speed integrated circuits; CMOS; electrostatic discharging protection structure; fuse based field dispensable ESD protection; size 28 nm; ultrahigh speed IC; CMOS integrated circuits; Current measurement; Electrostatic discharges; Fuses; Loss measurement; Metals; Field-dispensable ESD protection; fuse;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2014.2300496
