• DocumentCode
    1762392
  • Title

    Selective State Retention Power Gating Based on Gate-Level Analysis

  • Author

    Greenberg, Shlomo ; Rabinowicz, Joseph ; Tsechanski, Ron ; Paperno, Eugene

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben Gurion Univ., Beer-Sheva, Israel
  • Volume
    61
  • Issue
    4
  • fYear
    2014
  • fDate
    41730
  • Firstpage
    1095
  • Lastpage
    1104
  • Abstract
    This work presents a novel approach based on gate-level analysis for implementing Selective State Retention Power Gating (SSRPG). A selective SRPG approach mitigates the area and power overhead of the conventional SRPG technique. However, only very few papers suggesting a selective SPRG approach were published. The proposed SSRPG technique employs a formal analysis and, therefore, does not require exhaustive simulations. To implement the new approach, an automatic algorithm, which is performed on a gate-level netlist, has been developed. This algorithm enables the extraction of a subset of flip-flops that is sufficient for a proper state retention power gating. Unique selective SRPG criteria have been defined to support the proposed algorithm. These criteria are used to reduce the total amount of the required retention cells. To the best of our knowledge, this is the first robust SSRPG approach using gate-level analysis for selecting a reduced sub set of FFs that require retention. The proposed approach has been applied to a practical design with about 3300 FFs. The experimental results show 78% reduction of the retention SPRG cell area overhead, compared to the common SRPG approach.
  • Keywords
    flip-flops; SRPG technique; area overhead mitigation; automatic algorithm; flip-flops; formal analysis; gate-level analysis; gate-level netlist; power overhead mitigation; selective state retention power gating; Equations; Input variables; Logic gates; Master-slave; Power demand; Solid modeling; Vectors; Low power design; power gating; selective state retention power gating; state retention power gating;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2013.2286029
  • Filename
    6668988