• DocumentCode
    1762486
  • Title

    77–110 GHz 65-nm CMOS Power Amplifier Design

  • Author

    Kun-Long Wu ; Kuan-Ting Lai ; Hu, Rose ; Jou, Christina F. ; Dow-Chih Niu ; Yu-Shao Shiao

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    4
  • Issue
    3
  • fYear
    2014
  • fDate
    41760
  • Firstpage
    391
  • Lastpage
    399
  • Abstract
    This paper details the development of our millimeter- wave wideband power amplifier design. By treating the power combiner as an impedance transformer which allows different loading impedance to be taken into account, a compact wideband power-combining network can be constructed. With small transmission-line attenuation being sustained and maximum output power easily extracted from the transistors over the 77- 110 GHz frequency range, a power amplifier can then be designed using 65-nm CMOS process to cover the whole W-band. In the on-wafer measurement, the gain is around 18 dB, the output reflection coefficients is below -10 dB, and the output-referred 1 dB compression point can reach 12 dBm at 1.2 V bias condition; when the bias is increased to 2.5 V, a 18 dBm output power is recorded. To our knowledge, this is the first CMOS power amplifier that covers the whole W-band.
  • Keywords
    CMOS integrated circuits; field effect MIMIC; impedance convertors; integrated circuit measurement; millimetre wave power amplifiers; power combiners; wideband amplifiers; CMOS power amplifier design; frequency 77 GHz to 110 GHz; impedance transformer; millimeter wave wideband power amplifier design; on-wafer measurement; size 65 nm; transmission line attenuation; voltage 1.2 V; voltage 2.5 V; wideband power-combining network; Impedance; Loading; Power combiners; Power transmission lines; Solids; Transistors; Tuning; CMOS; impedance transformation; millimeter - wave; power amplifier; power combining; wideband;
  • fLanguage
    English
  • Journal_Title
    Terahertz Science and Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-342X
  • Type

    jour

  • DOI
    10.1109/TTHZ.2014.2315451
  • Filename
    6807854