• DocumentCode
    1762514
  • Title

    Damping Controller Design for Nanopositioners: A Mixed Passivity, Negative-Imaginary, and Small-Gain Approach

  • Author

    Das, Sajal K. ; Pota, Hemanshu R. ; Petersen, Ian R.

  • Author_Institution
    Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
  • Volume
    20
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    416
  • Lastpage
    426
  • Abstract
    A design of a damping controller to damp the first resonant mode of a piezoelectric tube scanner (PTS) used in most commercial atomic force microscopes (AFMs) is proposed in this study. The design of the controller is carried out by proposing a novel analytical framework. The analytical framework examines the finite-gain stability for a positive feedback interconnection between two stable linear time-invariant systems, where one system has mixed passivity, negative-imaginary, and small-gain properties and the other system has mixed negative-imaginary, negative-passivity, and small-gain properties. Experimental results are presented to show the effectiveness of the proposed analytical framework to design the proposed controller.
  • Keywords
    atomic force microscopy; control system synthesis; damping; feedback; interconnected systems; linear systems; nanopositioning; optical scanners; piezoelectric devices; pipes; resonance; stability; AFM; PTS; atomic force microscope; damping controller design; finite gain stability; mixed negative imaginary; mixed passivity; nanopositioner; negative passivity; piezoelectric tube scanner; positive feedback interconnection; resonant mode damping; small gain property; stable linear time invariant system; Damping; Force; Nanopositioning; Nickel; Sensors; Stability analysis; Transfer functions; Atomic force microscopes; damping control; nanopositioners; negative-imaginary system; resonant control; vibration control;
  • fLanguage
    English
  • Journal_Title
    Mechatronics, IEEE/ASME Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4435
  • Type

    jour

  • DOI
    10.1109/TMECH.2014.2331321
  • Filename
    6857414