Title :
Temperature Stability of SNIS Josephson Arrays Between 4.2 K and Critical Temperature in Cryocooler
Author :
Sosso, A. ; Trinchera, B. ; Monticone, E. ; Fretto, M. ; Durandetto, P. ; Lacquaniti, V.
Author_Institution :
Ist. Naz. di Ricerca Metrol., Turin, Italy
Abstract :
Cryogen-free operation is essential to expand applications of superconductivity, is unavoidable in some special cases and, in perspective, provides a solution to the expected shortages of liquid helium. In electrical metrology applications, high-temperature operation to reduce the refrigerator size and complexity is not yet possible since arrays of Josephson junctions for voltage standard applications made with high-temperature superconductors are not presently available. The superconductor-normal metal-insulator-superconductor (SNIS) technology developed at INRIM uses low-temperature superconductors but allows operation at temperatures close to 6 K. Thus, it is interesting for the cryocooler operation of a programmable voltage standard. We report on measurements of SNIS devices cooled with a closed-cycle refrigerator and in liquid helium to test the electrical behavior and its dependence on specific fabrication parameters that can be used to optimize the temperature stability.
Keywords :
cooling; high-temperature superconductors; refrigerators; superconducting junction devices; superconducting transition temperature; SNIS Josephson junction arrays; SNIS device measurements; closed-cycle refrigerator; critical temperature; cryocooler; cryogen-free operation; electrical metrology applications; high-temperature superconductors; liquid helium; low-temperature superconductors; programmable voltage standard; refrigerator complexity reduction; refrigerator size reduction; superconductivity; superconductor-normal metal-insulator-superconductor technology; temperature stability; Helium; High-temperature superconductors; Josephson junctions; Junctions; Standards; Temperature dependence; Temperature measurement; Cryocoolers; Josephson Junctions; Josephson junctions; Metrology; Temperature effects; Voltage standards; metrology; temperature effects; voltage standards;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2383173