DocumentCode :
176259
Title :
Software Defect Prediction for LSI Designs
Author :
Parizy, Matthieu ; Takayama, K. ; Kanazawa, Yuji
Author_Institution :
Design Eng. Lab., FUJITSU Labs. Ltd., Kawasaki, Japan
fYear :
2014
fDate :
Sept. 29 2014-Oct. 3 2014
Firstpage :
565
Lastpage :
568
Abstract :
While mining software repositories is a field which has greatly grown over the last ten years, Large Scale Integrated circuit (LSI) design repository mining has yet to reach the momentum of software´s. We felt that it represents untouched potential especially for defect prediction. In an LSI, referred to as hardware later on, verification has a high cost compared to design. After studying existing software defect prediction techniques based on repository mining, we decided to adapt some for hardware design repositories in the hope of saving precious resources by focusing design and verification effort on the most defect prone parts of the design. By focusing our resources on the previously mentioned parts, we hope to improve our designs quality. We discuss how we applied these prediction techniques to hardware and show our results are promising for the future of hardware repository mining. Our results allowed us to estimate a possible total verification time reduction of 12%.
Keywords :
electronic design automation; integrated circuit design; large scale integration; LSI design; hardware design repository; hardware repository mining; large scale integrated circuit; software defect prediction; Correlation; Data mining; Entropy; Hardware; Hardware design languages; Measurement; Software; LSI; code change; code metrics; defect prediction; hardware; repository mining;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Maintenance and Evolution (ICSME), 2014 IEEE International Conference on
Conference_Location :
Victoria, BC
ISSN :
1063-6773
Type :
conf
DOI :
10.1109/ICSME.2014.96
Filename :
6976140
Link To Document :
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