• DocumentCode
    1762689
  • Title

    Design of Efficient Content Addressable Memories in High-Performance FinFET Technology

  • Author

    Bhattacharya, Debajit ; Bhoj, Ajay N. ; Jha, Niraj K.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
  • Volume
    23
  • Issue
    5
  • fYear
    2015
  • fDate
    42125
  • Firstpage
    963
  • Lastpage
    967
  • Abstract
    Content addressable memories (CAMs) enable high-speed parallel search operations in table lookup-based applications, such as Internet routers and processor caches. Traditional CAM design has always suffered from the high dynamic power consumption associated with its large and active parallel hardware. However, deeply scaled technology nodes, with multigate devices replacing planar MOSFETs, are expected to bring new tradeoffs to CAM design. FinFET, a vertical-channel gate-wrap-around double-gate device, has emerged as the best alternative to planar MOSFET. In this brief, for the first time, we explore the design space of symmetric and asymmetric gate-workfunction FinFET CAMs. We propose several design alternatives and evaluate them in terms of their dc and transient metrics for different mismatch probabilities using technology computer-aided design simulations with 22-nm FinFET devices. We also propose two orthogonal layout styles for CAM design and show that one of them (vertical-search line) outperforms the other (vertical-match line) in terms of total power (22.3%) and search delay (5.8%).
  • Keywords
    MOSFET; content-addressable storage; table lookup; technology CAD (electronics); CAM design; FinFET technology; Internet router; asymmetric gate-workfunction; content addressable memory; high-speed parallel search operation; parallel hardware; planar MOSFET; power consumption; probability; processor cache; size 22 nm; symmetric gate-workfunction; table lookup-based application; technology computer-aided design simulation; verticalchannel gate-wrap-around double-gate device; Cams; Capacitance; Computer aided manufacturing; FinFETs; Layout; Logic gates; Measurement; Content addressable memories (CAMs); FinFET; parasitic extraction; technology computer-aided design (TCAD); technology computer-aided design (TCAD).;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2319192
  • Filename
    6857432