DocumentCode :
1762689
Title :
Design of Efficient Content Addressable Memories in High-Performance FinFET Technology
Author :
Bhattacharya, Debajit ; Bhoj, Ajay N. ; Jha, Niraj K.
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
Volume :
23
Issue :
5
fYear :
2015
fDate :
42125
Firstpage :
963
Lastpage :
967
Abstract :
Content addressable memories (CAMs) enable high-speed parallel search operations in table lookup-based applications, such as Internet routers and processor caches. Traditional CAM design has always suffered from the high dynamic power consumption associated with its large and active parallel hardware. However, deeply scaled technology nodes, with multigate devices replacing planar MOSFETs, are expected to bring new tradeoffs to CAM design. FinFET, a vertical-channel gate-wrap-around double-gate device, has emerged as the best alternative to planar MOSFET. In this brief, for the first time, we explore the design space of symmetric and asymmetric gate-workfunction FinFET CAMs. We propose several design alternatives and evaluate them in terms of their dc and transient metrics for different mismatch probabilities using technology computer-aided design simulations with 22-nm FinFET devices. We also propose two orthogonal layout styles for CAM design and show that one of them (vertical-search line) outperforms the other (vertical-match line) in terms of total power (22.3%) and search delay (5.8%).
Keywords :
MOSFET; content-addressable storage; table lookup; technology CAD (electronics); CAM design; FinFET technology; Internet router; asymmetric gate-workfunction; content addressable memory; high-speed parallel search operation; parallel hardware; planar MOSFET; power consumption; probability; processor cache; size 22 nm; symmetric gate-workfunction; table lookup-based application; technology computer-aided design simulation; verticalchannel gate-wrap-around double-gate device; Cams; Capacitance; Computer aided manufacturing; FinFETs; Layout; Logic gates; Measurement; Content addressable memories (CAMs); FinFET; parasitic extraction; technology computer-aided design (TCAD); technology computer-aided design (TCAD).;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2319192
Filename :
6857432
Link To Document :
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