Near-Field Microwave Investigation of Electrical Properties of Graphene-ITO Electrodes for LED Applications

Author

Monti, Tamara ; Di Donato, A. ; Mencarelli, Davide ; Venanzoni, G. ; Morini, A. ; Farina, Marcello

Author_Institution

Dipt. di Ing. dell´Inf., Univ. Politec. delle Marche, Ancona, Italy

Volume

9

Issue

6

fYear

2013

fDate

41426

Firstpage

504

Lastpage

510

Abstract

We propose a method to evaluate the electrical properties of nanoscale layered materials. This study is important for the potential application of these structures in light emitting diode electrodes. For this purpose we measure the reflection coefficient of a microwave signal recorded by a near-field Scanning Microwave Microscope. This method allows the non-contact measurement of the sheet resistance of the material under analysis. It provides detailed maps of the electrical properties of a micrometric area under test to assay its uniformity. In particular, we have applied this technique to a multilayer material composed by an Indium-Tin-Oxide film and few layer graphene.

Keywords

electrodes; graphene; indium compounds; light emitting diodes; microwave imaging; microwave measurement; nanophotonics; nanostructured materials; optical multilayers; C; LED; electrical properties; graphene layer; graphene-ITO electrodes; indium-tin-oxide film; light emitting diode electrodes; multilayer material; nanoscale layered materials; near-field scanning microwave microscope; reflection coefficient; sheet resistance; Electrodes; Graphene; Indium tin oxide; Microwave imaging; Microwave measurements; Microwave theory and techniques; Resistance; Graphene; light-emitting diodes (LEDs); microwave imaging; microwave measurements; nanotechnology; scanning probe microscopy;

fLanguage

English

Journal_Title

Display Technology, Journal of

Publisher

ieee

ISSN

1551-319X

Type

jour

DOI

10.1109/JDT.2013.2251608

Filename

6482238