• DocumentCode
    1762986
  • Title

    An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators

  • Author

    Garampazzi, Marco ; Dal Toso, Stefano ; Liscidini, Antonio ; Manstretta, Danilo ; Mendez, Pablo ; Romano, Lucia ; Castello, Rinaldo

  • Author_Institution
    Univ. of Pavia, Pavia, Italy
  • Volume
    49
  • Issue
    3
  • fYear
    2014
  • fDate
    41699
  • Firstpage
    635
  • Lastpage
    645
  • Abstract
    An intuitive yet sufficiently accurate formulation of the phase noise of various commonly used oscillators, including most types of class-B (standard, AC-coupled and with tail filter) and class-C, is derived and used to compare their fundamental limitations. A noise factor that represents the difference between the maximum achievable Figure of Merit and the actual one is derived for all topologies considered. Measurements on a dedicated chip prototype that integrates two high performance topologies allow to verify, in an unbiased way, the accuracy of the predictions. A very good agreement between the model and both simulation and measurement is obtained.
  • Keywords
    LC circuits; oscillators; phase noise; LC oscillator benchmarking; class-B oscillators; class-C oscillators; figure-of-merit; high-performance topology; noise factor; phase noise fundamental limit; Integrated circuit modeling; Phase noise; Switching circuits; Topology; Transistors; CMOS integrated circuits; Class-B; GSM; class-C; class-F; excess noise factor (ENF); figure of merit (FoM); impulse sensitivity function; low-noise; phase noise; radio frequency integrated circuits; voltage controlled oscillators; wide tuning range oscillators;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2301760
  • Filename
    6737310