DocumentCode :
1762986
Title :
An Intuitive Analysis of Phase Noise Fundamental Limits Suitable for Benchmarking LC Oscillators
Author :
Garampazzi, Marco ; Dal Toso, Stefano ; Liscidini, Antonio ; Manstretta, Danilo ; Mendez, Pablo ; Romano, Lucia ; Castello, Rinaldo
Author_Institution :
Univ. of Pavia, Pavia, Italy
Volume :
49
Issue :
3
fYear :
2014
fDate :
41699
Firstpage :
635
Lastpage :
645
Abstract :
An intuitive yet sufficiently accurate formulation of the phase noise of various commonly used oscillators, including most types of class-B (standard, AC-coupled and with tail filter) and class-C, is derived and used to compare their fundamental limitations. A noise factor that represents the difference between the maximum achievable Figure of Merit and the actual one is derived for all topologies considered. Measurements on a dedicated chip prototype that integrates two high performance topologies allow to verify, in an unbiased way, the accuracy of the predictions. A very good agreement between the model and both simulation and measurement is obtained.
Keywords :
LC circuits; oscillators; phase noise; LC oscillator benchmarking; class-B oscillators; class-C oscillators; figure-of-merit; high-performance topology; noise factor; phase noise fundamental limit; Integrated circuit modeling; Phase noise; Switching circuits; Topology; Transistors; CMOS integrated circuits; Class-B; GSM; class-C; class-F; excess noise factor (ENF); figure of merit (FoM); impulse sensitivity function; low-noise; phase noise; radio frequency integrated circuits; voltage controlled oscillators; wide tuning range oscillators;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2301760
Filename :
6737310
Link To Document :
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