DocumentCode :
1763199
Title :
Stochastic Behavioral Modeling and Analysis for Analog/Mixed-Signal Circuits
Author :
Gong, Fang ; Basir-Kazeruni, Sina ; He, Lei ; Yu, Hao
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Los Angeles, Los Angeles, CA, USA
Volume :
32
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
24
Lastpage :
33
Abstract :
It has become increasingly challenging to model the stochastic behavior of analog/mixed-signal (AMS) circuits under large-scale process variations. In this paper, a novel moment-matching-based method has been proposed to accurately extract the probabilistic behavioral distributions of AMS circuits. This method first utilizes Latin hypercube sampling coupling with a correlation control technique to generate a few samples (e.g., sample size is linear with number of variable parameters) and further analytically evaluate the high-order moments of the circuit behavior with high accuracy. In this way, the arbitrary probabilistic distributions of the circuit behavior can be extracted using moment-matching method. More importantly, the proposed method has been successfully applied to high-dimensional problems with linear complexity. The experiments demonstrate that the proposed method can provide up to 1666X speedup over crude Monte Carlo method for the same accuracy.
Keywords :
integrated circuit modelling; mixed analogue-digital integrated circuits; statistical distributions; stochastic processes; Latin hypercube sampling coupling; analog-mixed signal circuit; correlation control technique; high order moments; moment matching based method; moment matching method; probabilistic behavioral distribution; stochastic behavioral modeling; Accuracy; Approximation methods; Argon; Correlation; Integrated circuit modeling; Probabilistic logic; Random variables; Behavioral modeling; Latin hypercube sampling; Monte Carlo method; process variation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2217961
Filename :
6387696
Link To Document :
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