DocumentCode :
1763210
Title :
Underdesigned and Opportunistic Computing in Presence of Hardware Variability
Author :
Gupta, Puneet ; Agarwal, Yuvraj ; Dolecek, Lara ; Dutt, Nikil ; Gupta, Rajesh K. ; Kumar, Rakesh ; Mitra, Subhasish ; Nicolau, Alexandru ; Rosing, Tajana Simunic ; Srivastava, Mani B. ; Swanson, Steven ; Sylvester, Dennis
Author_Institution :
Univ. of California, Los Angeles, Los Angeles, CA, USA
Volume :
32
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
8
Lastpage :
23
Abstract :
Microelectronic circuits exhibit increasing variations in performance, power consumption, and reliability parameters across the manufactured parts and across use of these parts over time in the field. These variations have led to increasing use of overdesign and guardbands in design and test to ensure yield and reliability with respect to a rigid set of datasheet specifications. This paper explores the possibility of constructing computing machines that purposely expose hardware variations to various layers of the system stack including software. This leads to the vision of underdesigned hardware that utilizes a software stack that opportunistically adapts to a sensed or modeled hardware. The envisioned underdesigned and opportunistic computing (UnO) machines face a number of challenges related to the sensing infrastructure and software interfaces that can effectively utilize the sensory data. In this paper, we outline specific sensing mechanisms that we have developed and their potential use in building UnO machines.
Keywords :
integrated circuit design; integrated circuit reliability; integrated circuit yield; low-power electronics; computing machines; datasheet specifications; hardware variability; microelectronic circuits; opportunistic computing; power consumption; reliability parameters; sensing infrastructure; software interfaces; software stack; underdesigned computing; yield; Ash; Benchmark testing; Hardware; Power demand; Power measurement; Software; Temperature measurement; Computer architecture; design automation; design for manufacture; digital integrated circuits; micro-procesors; reliability; system software;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2012.2223467
Filename :
6387697
Link To Document :
بازگشت