Update on High-Impact Papers Presented at the IEEE Nuclear and Space Radiation Effects Conference: The View in 2013

Author

Galloway, Kenneth F. ; Primich, T.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

60

Issue

3

fYear

2013

fDate

41426

Firstpage

1674

Lastpage

1680

Abstract

This paper, an update of a paper published in 2003 (1), identifies a number of papers presented at the NSREC and published in the IEEE Transactions on Nuclear Science that have had measurable impact on radiation effects research and the radiation effects community. Criteria include papers selected for the Outstanding Paper Award at the NSREC or papers from the NSREC that have been highly cited by authors of other journal publications. Observations on the successes and failures of the methodology used for selecting high-impact papers are presented.

Keywords

nuclear engineering; AD 2003; AD 2013; IEEE Transactions on Nuclear Science; IEEE nuclear and space radiation effects conference; NSREC; high impact papers; radiation effects research; Awards activities; CMOS integrated circuits; Conferences; MOS capacitors; Radiation effects; Radiation hardening (electronics); Transistors; IEEE Nuclear and Space Radiation Effects Conference; IEEE Transactions on Nuclear Science; radiation effects; radiation effects in microelectronics: radiation hardening;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2013.2244614

Filename

6482273