Title :
Impact of Sampling Rate on RTN Time Constant Extraction and Its Implications on Bias Dependence and Trap Spectroscopy
Author :
Kapila, Gautam ; Reddy, Veerababu
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Inaccuracy in extraction of random telegraph noise (RTN) time constants due to an improper choice of measurement sampling rate is investigated. The sampling rate requirement for reliable extraction of RTN emission and capture times is analyzed. Consequences on transistor RTN bias dependence analysis and trap spectroscopy are discussed.
Keywords :
MOSFET; electric current measurement; semiconductor device measurement; semiconductor device models; semiconductor device noise; RTN emission; RTN time constant extraction; capture times; measurement sampling rate; random telegraph noise; sampling rate requirement; transistor RTN bias dependence analysis; trap spectroscopy; Current measurement; Erbium; Reliability; Time measurement; Time-frequency analysis; Transistors; Random telegraph noise (RTN); bias dependence; extraction; magnitude; time constants; trap spectroscopy;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2014.2305972
