DocumentCode :
1763764
Title :
A High Temperature Silicon Carbide mosfet Power Module With Integrated Silicon-On-Insulator-Based Gate Drive
Author :
Zhiqiang Wang ; Xiaojie Shi ; Tolbert, Leon M. ; Wang, Fei Fred ; Zhenxian Liang ; Costinett, Daniel ; Blalock, Benjamin J.
Author_Institution :
Nat. Transp. Res. Center, Oak Ridge Nat. Lab., Knoxville, TN, USA
Volume :
30
Issue :
3
fYear :
2015
fDate :
42064
Firstpage :
1432
Lastpage :
1445
Abstract :
This paper presents a board-level integrated silicon carbide (SiC) mosfet power module for high temperature and high power density application. Specifically, a silicon-on-insulator (SOI)-based gate driver capable of operating at 200 °C ambient temperature is designed and fabricated. The sourcing and sinking current capability of the gate driver are tested under various ambient temperatures. Also, a 1200 V/100 A SiC mosfet phase-leg power module is developed utilizing high temperature packaging technologies. The static characteristics, switching performance, and short-circuit behavior of the fabricated power module are fully evaluated at different temperatures. Moreover, a buck converter prototype composed of the SOI gate driver and SiC power module is built for high temperature continuous operation. The converter is operated at different switching frequencies up to 100 kHz, with its junction temperature monitored by a thermosensitive electrical parameter and compared with thermal simulation results. The experimental results from the continuous operation demonstrate the high temperature capability of the power module at a junction temperature greater than 225 °C.
Keywords :
driver circuits; high-temperature electronics; modules; power MOSFET; semiconductor device packaging; silicon compounds; silicon-on-insulator; wide band gap semiconductors; MOSFET phase-leg power module; SOI; SiC; board-level integrated silicon carbide MOSFET power module; buck converter prototype; current 100 A; high temperature continuous operation; high temperature packaging technology; high temperature silicon carbide MOSFET power module; integrated silicon-on-insulator-based gate drive; junction temperature; short-circuit behavior; static characteristics; switching performance; temperature 200 degC; thermal simulation; thermosensitive electrical parameter; voltage 1200 V; Junctions; Logic gates; MOSFET; Multichip modules; Silicon carbide; Temperature; Temperature measurement; Power module; silicon carbide (SiC) mosfet; silicon-on-insulator (SOI); thermosensitive electrical parameter (TSEP);
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2014.2321174
Filename :
6808516
Link To Document :
بازگشت