DocumentCode :
1763858
Title :
NAND Flash Innovations
Author :
Aritome, Seiichi
Author_Institution :
R&D Div., SK Hynix, Icheon, South Korea
Volume :
5
Issue :
4
fYear :
2013
fDate :
Fall 2013
Firstpage :
21
Lastpage :
29
Abstract :
Recent progress in mobile equipments (ex. smartphone and tablet-PC) requires further effort in developing higher density and higher reliability nonvolatile semiconductor memories. A breakthrough in the field of nonvolatile memories was the invention of the Flash memory by Prof. Fujio Masuoka [1]. The Flash memory had many advantages in comparison with other nonvolatile memories. Therefore, the development of Flash memory has been explosively accelerated.
Keywords :
NAND circuits; circuit reliability; flash memories; random-access storage; NAND flash innovations; flash memory; mobile equipments; nonvolatile semiconductor memories; reliability; Flash memories; Mobile communication; Mobile handsets; Nonvolatile memory; Semiconductor memory; Smart phones;
fLanguage :
English
Journal_Title :
Solid-State Circuits Magazine, IEEE
Publisher :
ieee
ISSN :
1943-0582
Type :
jour
DOI :
10.1109/MSSC.2013.2278083
Filename :
6670214
Link To Document :
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