DocumentCode :
1763887
Title :
Configurable Circuits Featuring Dual-Threshold-Voltage Design With Three-Independent-Gate Silicon Nanowire FETs
Author :
Jian Zhang ; Xifan Tang ; Gaillardon, Pierre-Emmanuel ; De Micheli, G.
Author_Institution :
Integrated Syst. Lab. (LSI), Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
Volume :
61
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
2851
Lastpage :
2861
Abstract :
Silicon nanowire transistors with Schottky-barrier contacts exhibit both n-type and p-type characteristics under different bias conditions. Polarity controllability of silicon nanowire transistors has been further demonstrated by using an additional polarity gate. The device can be configured as n-type or p-type by controlling the polarity gate voltage. This paper extends this approach by using three independent gates and shows its interest to implement dual-threshold-voltage configurable circuits. Polarity and threshold voltage of uncommitted devices are determined by applying different bias patterns to the three gates. Uncommitted logic gates can thus be configured to implement different logic functions, targeting either high-performance or low-leakage applications. Dual-threshold-voltage design is thereby achievable through the use of a wiring scheme on an uncommitted pattern. With the polarity controllability of the three-independent-gate device, a range of logic functions is also obtained by replacing VDD and GND by complementary input signals. Synthesis results of ISCAS´85 and VTR sequential benchmark circuits with these devices show, before place and route, comparable performance and 51% reduction of leakage power consumption compared to 22-nm low-standby-power FinFET technology.
Keywords :
MOSFET; Schottky barriers; elemental semiconductors; field effect transistors; nanowires; semiconductor device models; sequential circuits; silicon; FinFET technology; ISCAS´85; Schottky-barrier contacts; Si; VTR sequential benchmark circuits; dual-threshold-voltage configurable circuits; dual-threshold-voltage design; logic functions; logic gates; power consumption; silicon nanowire transistors; size 22 nm; Logic gates; Performance evaluation; Power demand; Schottky barriers; Silicon; Threshold voltage; Transistors; Ambipolar; configurable; dual-threshold-voltage; silicon nanowire;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2014.2333675
Filename :
6858094
Link To Document :
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