• DocumentCode
    1763904
  • Title

    A 64 fJ/step 9-bit SAR ADC Array With Forward Error Correction and Mixed-Signal CDS for CMOS Image Sensors

  • Author

    Chen, Denis Guangyin ; Fang Tang ; Man-Kay Law ; Xiaopeng Zhong ; Bermak, Amine

  • Author_Institution
    Electron. & Comput. Eng. Dept., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • Volume
    61
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    3085
  • Lastpage
    3093
  • Abstract
    A 9 b Successive-Approximation-Register (SAR) Anglog-to-Digital Converter (ADC) with pilot-Digital-to-Analog Converter (pDAC) technique for image sensor applications is described in this paper. Its Forward Error Correction (FEC) improves its robustness against device mismatch. It performs mixed-signal Correlated-Double-Sampling (CDS) using only the ADC´s built-in capacitor array without any additional amplifier or memory. The ADC measures 490μm×7.4μm and is demonstrated in a low-power CMOS image sensors with column parallel ADCs. Measurement results from the prototype image sensor in 0.18 μm technology shows that the ADC´s Differential Non-Linearity (DNL) is reduced from 3.5 LSB to 1.2 LSB by its mixed-signal FEC algorithm, making its Figure-of-Merit (FoM) 64 fJ/step. Furthermore, when combined with the ADC´s mixed-signal Correlated-Double-Sampling, the column FPN is reduced from 3.2% to 0.5% without any additional circuit.
  • Keywords
    CMOS image sensors; analogue-digital conversion; digital-analogue conversion; forward error correction; low-power electronics; SAR ADC array; column parallel ADC; differential nonlinearity; forward error correction; low-power CMOS image sensors; mixed signal correlated double sampling; mixed-signal CDS; mixed-signal FEC algorithm; size 0.18 mum; size 490 mum; size 7.4 mum; successive approximation register analog-to-digital converter; word length 9 bit; Arrays; Capacitance; Capacitors; Forward error correction; Image sensors; Quantization (signal); Switches; CMOS image sensor (CIS); column-parallel SAR ADC; correlated double sampling (CDS); error correction; single-ended ADC;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2014.2334852
  • Filename
    6858095