DocumentCode :
1763981
Title :
Influence of Cracks in the Superconductor Layers Caused by Mechanical Stresses on Critical Currents and AC Transport Losses in YBCO CCs
Author :
Isozaki, Kousuke ; Noda, Toshio ; Iwasaki, Shoichi ; Honzawa, R. ; Ojima, T. ; Takao, Tomoaki ; Iida, Yuki ; Ogino, Tadashi ; Tsukamoto, Osami
Author_Institution :
Fac. of Sci. & Technol., Sophia Univ., Tokyo, Japan
Volume :
23
Issue :
3
fYear :
2013
fDate :
41426
Firstpage :
6601504
Lastpage :
6601504
Abstract :
Influence of mechanical stresses on critical currents and ac transport losses in YBCO CCs with copper stabilization layers is investigated by ac loss measurement and SEM observation of surfaces of YBCO layers. Tested YBCO strips were made by slitting mechanically a wide tape. Cracks caused by the slitting were found in the YBCO layer even in the virgin strips in the edge side areas. Mechanical stresses to strips widen and grow those original cracks. In the paper, the characteristics of critical current and ac transport current losses depending on mechanical stresses are explained in relation to features of the cracks.
Keywords :
barium compounds; cracks; critical currents; high-temperature superconductors; scanning electron microscopy; superconducting tapes; tensile strength; yttrium compounds; SEM; YBCO; YBCO coated conductor; YBCO strips; YBCO tape; ac transport losses; copper stabilization layers; cracks; critical currents; edge side areas; mechanical stresses; scanning electron microscopy; superconductor layers; tensile stress; virgin strips; Critical current; Loss measurement; Strain; Strips; Tensile stress; Yttrium barium copper oxide; AC losses; SEM; YBCO coated conductor; copper layer; cracks; repeated tensile stress;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2235496
Filename :
6389724
Link To Document :
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