DocumentCode :
1764031
Title :
Spectral Domain Analysis of Open Single and Coupled Microstrip Lines With Polygonal Cross-Section in Bound and Leaky Regimes
Author :
Coluccini, G. ; Lucido, Mario ; Panariello, Gaetano
Author_Institution :
MBDA Italia S.p.A., Rome, Italy
Volume :
61
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
736
Lastpage :
745
Abstract :
Aim of this work is the analysis of the propagation of bound and leaky modes in perfectly conducting open single and coupled microstrip lines with polygonal cross-section. The problem is formulated as a new numerically stable one-dimensional electric field integral equation (EFIE) in the spectral domain. Quick convergence is achieved by expanding the unknown surface current density with functions reconstructing the edge behaviour and continuity conditions in a Galerkin scheme. Due to the reciprocity, the impedance matrix has symmetries allowing to cut down the number of coefficients to be numerically evaluated. The choice of analytically Fourier transformable expansion functions leads to reduce the coefficients of the impedance matrix to single integrals efficiently evaluated by means of an analytical acceleration technique.
Keywords :
Galerkin method; current density; electric field integral equations; microstrip lines; Fourier transformable expansion functions; Galerkin scheme; analytical acceleration technique; bound regimes; coupled microstrip lines; edge behaviour; electric field integral equation; leaky regimes; open single; polygonal cross-section; quick convergence; spectral domain analysis; unknown surface current density; Convergence; Impedance; Integral equations; Microstrip; Spectral analysis; Surface impedance; Transmission line matrix methods; Microstrip lines; polygonal cross-section; spectral domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2012.2231424
Filename :
6389731
Link To Document :
بازگشت