Title :
Electromagnetic Interference Resisting Operational Amplifier
Author :
Jingjing Yu ; Amer, Aishy ; Sanchez-Sinencio, Edgar
Author_Institution :
Electr. Eng. Dept., Texas A&M Univ., College Station, TX, USA
Abstract :
This work proposes a robust electromagnetic interference (EMI) analog operational amplifier (OpAmp) based on a source-buffered differential pair. The proposed EMI performance has been verified via a test integrated circuit (IC) fabricated in NCSU 0.5 μm CMOS technology. Experimental results are presented when an EMI disturbance signal of 800 mV amplitude is injected at the input terminals and are then compared with the conventional and source-buffered topologies. The maximum EMI-induced input offset voltage corresponds to -222 mV for the proposed structure compared to a -712 mV input for a conventional one and -368 mV for a source-buffered one.
Keywords :
CMOS integrated circuits; differential amplifiers; electromagnetic interference; integrated circuit manufacture; operational amplifiers; EMI; IC; NCSU CMOS technology; OpAmp; analog operational amplifier; electromagnetic interference; integrated circuit; size 0.5 mum; source-buffered differential pair; voltage -222 mV; voltage -368 mV; voltage -712 mV; voltage 800 mV; Capacitance; Electromagnetic interference; Integrated circuits; Noise; Resistors; Topology; Transistors; $RC$ high-pass filters; Analog OPAMP; electromagnetic interference (EMI); source resistors; source-buffered;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2014.2298277
