Title :
A Flexible TFT Circuit Yield Optimizer Considering Process Variation, Aging, and Bending Effects
Author :
Wen-En Wei ; Hung-Yi Li ; Cheng-Yu Han ; Li, James Chien-Mo ; Jian-Jang Huang ; I-Chun Cheng ; Chien-Nan Liu ; Yung-Hui Yeh
Author_Institution :
Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This paper presents a yield optimization tool, FlexiOptimizer , for flexible thin-film transistor (TFT) circuits. FlexiOptimizer considers three important effects: (1) process variation; (2) aging effect; and (3) bending effect. This SPICE-based optimizer applies response surface methodology (RSM) and orthogonal array (OA) techniques to size transistors so the yield is improved in aged and bent condition. This tool is demonstrated on two different designs: organic light emitting diode (OLED) pixel drivers and differential operational amplifiers (OPAMPs), in both amorphous silicon (a-Si) and Indium-Gallium-Zinc-Oxide (IGZO) TFT technologies.
Keywords :
SPICE; ageing; bending; circuit optimisation; flexible electronics; response surface methodology; thin film transistors; transistor circuits; FlexiOptimizer; IGZO; OA; OLED pixel drivers; OPAMPs; RSM; SPICE-based optimizer; aging effect; amorphous silicon TFT technology; bending effects; differential operational amplifiers; flexible TFT circuit yield optimizer tool; indium-gallium-zinc-oxide TFT technologies; organic light emitting diode; orthogonal array techniques; process variation; response surface methodology; thin-film transistor; Aging; Fitting; Integrated circuit modeling; Mathematical model; Optimization; Organic light emitting diodes; Thin film transistors; Analog circuit optimization; flexible TFT; orthogonal array; response surface methodology;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2014.2340892
