• DocumentCode
    1764280
  • Title

    Library-Based Illumination Synthesis for Critical CMOS Patterning

  • Author

    Jue-Chin Yu ; Peichen Yu ; Hsueh-Yung Chao

  • Author_Institution
    Dept. of Photonics, Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    22
  • Issue
    7
  • fYear
    2013
  • fDate
    41456
  • Firstpage
    2811
  • Lastpage
    2821
  • Abstract
    In optical microlithography, the illumination source for critical complementary metal-oxide-semiconductor layers needs to be determined in the early stage of a technology node with very limited design information, leading to simple binary shapes. Recently, the availability of freeform sources permits us to increase pattern fidelity and relax mask complexities with minimal insertion risks to the current manufacturing flow. However, source optimization across many patterns is often treated as a design-of-experiments problem, which may not fully exploit the benefits of a freeform source. In this paper, a rigorous source-optimization algorithm is presented via linear superposition of optimal sources for pre-selected patterns. We show that analytical solutions are made possible by using Hopkins formulation and quadratic programming. The algorithm allows synthesized illumination to be linked with assorted pattern libraries, which has a direct impact on design rule studies for early planning and design automation for full wafer optimization.
  • Keywords
    CMOS integrated circuits; computational complexity; design of experiments; electronic design automation; lighting; linear programming; lithography; quadratic programming; risk analysis; semiconductor technology; technology management; Hopkins formulation; critical CMOS patterning; critical complementary metal-oxide-semiconductor layers; current manufacturing flow; design automation; design-of-experiments problem; freeform sources; illumination source; library-based illumination synthesis; linear superposition; minimal insertion risks; optical microlithography; optimal sources; pattern fidelity; pattern libraries; preselected patterns; quadratic programming; relax mask complexities; simple binary shapes; source optimization; source-optimization algorithm; synthesized illumination; technology node; wafer optimization; Algorithm design and analysis; Eigenvalues and eigenfunctions; Indexes; Lighting; Linear programming; Manufacturing; Optimization; Inverse lithography; objective function; optical lithography; segment-based optical proximity correction (OPC); source mask optimization (SMO); source synthesis;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/TIP.2013.2253482
  • Filename
    6482625