Shunt-Enhanced, Lead-Driven Bifurcation of EEC Sensor Responsivity

We report the observed bifurcation in extraordinary electroconductance (EEC) sensor response to direct reverse bias based on measurement lead location as well as a dramatic enhancement in responsivity achieved via a modification of the shunt geometry. A maximum percent change in the four-point resistance of 130856% was achieved under a direct reverse bias of -1 V using an enhanced shunt design, a 325 fold increase over the conventional EEC square shunt design. This result was accompanied by an observed bifurcation in sensor response, driven by a rotation of the four-point measurement leads.