• DocumentCode
    1764432
  • Title

    Ge Nanowire nMOSFET Design With Optimum Band Structure for High Ballistic Drive Current

  • Author

    Raseong Kim ; Avci, Uygar E. ; Young, Ian A.

  • Author_Institution
    Components Res., Intel Corp., Hillsboro, OR, USA
  • Volume
    36
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    751
  • Lastpage
    753
  • Abstract
    Through a physics-based model and a numerical simulation, it is revealed that Ge nanowires (NWs) with the $langle 110rangle $ transport direction may deliver high intrinsic/ballistic drive currents for scaled nMOSFETs due to the optimum quantum-confined NW band structure. The quantum confinement of L-valleys in Ge $langle 110rangle $ NW delivers both high density-of-states (DOS) due to the multiple valley degeneracy and high carrier injection velocity ($upsilon _{rm inj}$ ) due to the light carrier transport mass. Comparisons of NW nMOSFETs (gate length of 13 nm) for Si, InAs, and Ge channels show that the ballistic drive currents of Ge $langle 110rangle $ NW device are improved over Si and InAs NW devices due to the optimum combination of $upsilon _{rm inj}$ (higher than in Si) and DOS (higher than in InAs). The transport/confinement orientation is critical, e.g., Ge $langle 100rangle $ NW does not deliver any drive current improvement over Si.
  • Keywords
    III-V semiconductors; MOSFET; elemental semiconductors; germanium; indium compounds; many-valley semiconductors; nanowires; silicon; Ge; InAs; L-valleys; NW band structure; Si; high ballistic drive current; high carrier injection velocity; light carrier transport mass; multiple valley degeneracy; nanowire nMOSFET design; optimum band structure; physics-based model; quantum confinement; size 13 nm; Logic gates; MOSFET; MOSFET circuits; Nanoscale devices; Performance evaluation; Silicon; Germanium; III-V semiconductor material; MOSFET; nanowires; semiconductor device modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2445915
  • Filename
    7124437