• DocumentCode
    1764575
  • Title

    A Supply Voltage and Temperature Variation-Tolerant Relaxation Oscillator for Biomedical Systems Based on Dynamic Threshold and Switched Resistors

  • Author

    Zhentao Xu ; Wei Wang ; Ning Ning ; Wei Meng Lim ; Yang Liu ; Qi Yu

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    23
  • Issue
    4
  • fYear
    2015
  • fDate
    42095
  • Firstpage
    786
  • Lastpage
    790
  • Abstract
    A fully integrated supply voltage and temperature variation-tolerant relaxation oscillator for biomedical systems has been presented. Concepts of dynamic threshold and switched resistors are proposed to improve the frequency stability against power supply and temperature variations, respectively. This design was verified in a 0.35-μm standard CMOS process with a 3 V supply. Measurement results show the frequency drift of 0.6% from 2.4 to 4.0 V and temperature stability of 53.9 ppm/°C as temperature varied from -30 °C to 120 °C at a typical working frequency of 4 MHz. With the consideration of resistor and transistor matching, the oscillator was implemented in a core area of 0.05 mm2.
  • Keywords
    CMOS analogue integrated circuits; biomedical electronics; circuit stability; frequency stability; relaxation oscillators; resistors; switched networks; transistors; biomedical system; frequency 4 MHz; frequency stability; fully integrated supply voltage; size 0.35 mum; standard CMOS process; switched resistor matching; temperature -30 degC to 120 degC; temperature variation-tolerant relaxation oscillator; transistor matching; voltage 2.4 V to 4.0 V; Capacitors; Circuit stability; Frequency measurement; Oscillators; Resistors; Temperature measurement; Thermal stability; Biomedical systems; clock generator; dynamic threshold (DT); frequency stability; relaxation oscillator; switched resistors (SRs); switched resistors (SRs).;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2317722
  • Filename
    6809171