Title :
Semianalytical Model of the Subthreshold Current in Short-Channel Junctionless Symmetric Double-Gate Field-Effect Transistors
Author :
Gnudi, A. ; Reggiani, S. ; Gnani, Elena ; Baccarani, G.
Author_Institution :
Adv. Res. Center for Electron. Syst., Univ. of Bologna, Bologna, Italy
Abstract :
A 2-D semianalytical solution for the electrostatic potential valid for junctionless symmetric double-gate field-effect transistors in subthreshold regime is proposed, which is based on the parabolic approximation for the potential and removes previous limitations. Based on such a solution, a semi-analytical expression for the current is derived. The potential and current models are validated through comparisons with TCAD simulations and are used to evaluate relevant short-channel effect parameters, such as threshold roll-off, drain-induced barrier lowering, and inverse subthreshold slope. The implications of different possible definitions of threshold voltage, either based on the potential in the channel or on a fixed current level, are discussed. Finally, a fully analytical simplification for the current is suggested, which can be used in compact models for circuit simulations.
Keywords :
circuit simulation; field effect transistors; semiconductor device models; technology CAD (electronics); 2D semianalytical solution; TCAD; circuit simulations; electrostatic potential; parabolic approximation; semi-analytical expression; semianalytical model; short-channel junctionless symmetric double-gate field-effect transistors; subthreshold current; threshold voltage; Analytical models; Approximation methods; Electric potential; Logic gates; Mathematical model; Silicon; Threshold voltage; Depletion-mode field-effect transistor (FET); double-gate field-effect transistor (DG FET); drain-induced barrier lowering (DIBL); inverse subthreshold slope (SS); junctionless field-effect transistor (JL FET);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2013.2247765