DocumentCode :
1764769
Title :
Bandgap Control for Intersubband Transition in InGaAs/AlAsSb Coupled Double Quantum Wells
Author :
Jijun Feng ; Akimoto, Ryoichi ; Gozu, Shin-ichiro ; Mozume, Teruo ; Hasama, Toshifumi ; Ishikawa, Hiroshi
Author_Institution :
Network Photonics Res. Center, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Volume :
25
Issue :
15
fYear :
2013
fDate :
Aug.1, 2013
Firstpage :
1474
Lastpage :
1477
Abstract :
This letter demonstrates bandgap control of ion-induced intermixing on InGaAs/AlAsSb coupled double quantum wells (CDQWs). With phosphorus ion implantation and different rapid thermal annealing (RTA) processes, the blueshift of the bandgap profile can be tailored. The influence of quantum well intermixing on the cross-phase modulation (XPM), caused by the intersubband transition in the CDQWs, is also experimentally investigated. Higher RTA temperature or longer annealing time could cause a larger bandgap blueshift that decreases the XPM efficiency. After annealing, the implanted CDQWs have a relatively low transmission loss, whereas the non-implanted sample can maintain a high XPM efficiency. This result can be used for monolithic integration of different bandgap modules with spatially selective mannerisms, and the implications are vast for optical communication applications.
Keywords :
III-V semiconductors; aluminium compounds; energy gap; gallium arsenide; indium compounds; ion implantation; optical materials; optical modulation; phase modulation; phosphorus; rapid thermal annealing; semiconductor quantum wells; spectral line shift; CDQW; InGaAs-AlAsSb; RTA; XPM; annealing; bandgap control; bandgap modules; blueshift; coupled double quantum wells; cross-phase modulation; intersubband transition; ion-induced intermixing; phosphorus ion implantation; quantum well intermixing; rapid thermal annealing; transmission loss; Quantum well intermixing; intersubband transition; rapid thermal annealing;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2013.2267774
Filename :
6530607
Link To Document :
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