Title :
Adaptive and Resilient Circuits for Dynamic Variation Tolerance
Author :
Bowman, Keith A. ; Tokunaga, Carlos ; Tschanz, James W. ; Karnik, Tanay ; De, Vivek K.
Author_Institution :
Intel, Hillsboro, OR, USA
Abstract :
This paper focuses on techniques to build more effective circuits for dynamic variation tolerance. Three main approaches are presented based on adaptive circuits, error detection and recovery techniques, and adaptive clock distribution. The tradeoffs in effectiveness and overhead of these different solutions are discussed.
Keywords :
clock and data recovery circuits; microprocessor chips; adaptive circuits; adaptive clock distribution; dynamic variation tolerance; error detection; recovery techniques; resilient circuits; Aging; Equipment; Fault tolerance; Resilience; Temperature measurement; Temperature sensors; Throughput; Adaptive circuit; adaptive clock distribution; resilient circuit; variation tolerance;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2267958
