Title :
An Analysis of Industrial SRAM Test Results—A Comprehensive Study on Effectiveness and Classification of March Test Algorithms
Author :
Linder, Michael ; Eder, Alfred ; Schlichtmann, Ulf ; Oberlander, Klaus
Abstract :
This paper deals with efficient test algorithm identification of embedded SRAMs. The approach is based on silicon test results of automotive microcontroller devices, which tries to identify efficient tests by removing unnecessary test patterns that cover the same subset of faults. Results of an industrial case under 29 test algorithms and a large amount of chips are obtained; among them, efficient ones are identified.
Keywords :
SRAM chips; automotive electronics; embedded systems; microcontrollers; testing; automotive microcontroller devices; embedded SRAM; industrial SRAM test; march test algorithms; silicon test results; Algorithm design and analysis; Classification algorithms; Cloud computing; Embedded systems; Fault detection; Heuristic algorithms; Microcontrollers; Random access memory; Classification; Functional Fault Models; March Algorithms; SRAM test;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2279752
