DocumentCode
1764802
Title
How to Respond to Process Module Failure in Residency Time-Constrained Single-Arm Cluster Tools
Author
Yan Qiao ; NaiQi Wu ; ChunRong Pan ; Mengchu Zhou
Author_Institution
Dept. of Ind. Eng., Guangdong Univ. of Technol., Guangzhou, China
Volume
27
Issue
4
fYear
2014
fDate
Nov. 2014
Firstpage
462
Lastpage
474
Abstract
Cyclic scheduling and operation of a residency time-constrained single-arm cluster tool with failure-prone process modules are highly challenging. In some cases, when a failure occurs, there still exists a feasible cyclic schedule for the performance-degraded tool. In other cases, such a schedule no longer exists. For the latter, it is highly desired to respond to a process module failure properly such that the tool can continue working and the wafers in the tool can be completed in a feasible way. This work is the first one to study this important issue. The idea is to apply Petri nets to describe the dynamic behavior of a single-arm cluster tool. With the developed Petri net model, this paper formulates failure response policies to control the cluster tool such that it can keep working without violating any residency time constraint. The failure response policies are implemented via efficient real-time control laws. Illustrative examples are presented to show their usage.
Keywords
Petri nets; failure analysis; scheduling; semiconductor device manufacture; Petri nets; cyclic scheduling; failure response policies; failure-prone process modules; performance-degraded tool; process module failure; residency time constraint; residency time-constrained single-arm cluster tool; Petri nets; Real-time systems; Robots; Scheduling; Semiconductor device manufacture; Steady-state; Time factors; Cluster tools; Failure response; Petri net; Scheduling; Wafer fabrication;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2014.2340858
Filename
6860284
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