• DocumentCode
    1764887
  • Title

    Maximizing Nanotechnology Education at Purdue University: Its Integration into the Electrical Engineering Technology Curriculum

  • Author

    McNally, Helen A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng. Tech, Purdue Univ., West Lafayette, IN, USA
  • Volume
    7
  • Issue
    3
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    19
  • Lastpage
    22
  • Abstract
    Nanotechnology education continues to be a national priority [5], [12] while requiring an integration of the basic disciplines (physics, chemistry, and biology) into the systems of engineering and technology. Training the next-generation workforce in this complex and highly interdisciplinary field presents many opportunities and challenges. Various nanotechnology courses and programs [1], [4], [15] have been developed with differing levels of success. The issues of prerequisite material, student selective interests, and program-specific requirements are a few of the challenges that have slowed the rate of nanotechnology education. Also, access to and training on scanning probe microscopes (SPMs), one of the premier tools of nanotechnology [2], has been limited, particularly at the undergraduate level. A few laboratories [7], [13] have been centered around the atomic force microscope (AFM), a subset of the SPM. However, these systems are expensive, and it is a challenge to retain the expertise necessary to maintain, operate, and train students on these systems.
  • Keywords
    atomic force microscopy; electrical engineering education; further education; nanotechnology; AFM; Purdue University; SPM; atomic force microscope; electrical engineering technology curriculum; nanotechnology course; nanotechnology education; next-generation workforce; program-specific requirement; scanning probe microscope; student selective interest; student training; undergraduate level; Educational institutions; Engineering education; Microscopy; Nanoscale devices; Nanotechnology;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1932-4510
  • Type

    jour

  • DOI
    10.1109/MNANO.2013.2275026
  • Filename
    6587496