Title :
A Sub-mW, Ultra-Low-Voltage, Wideband Low-Noise Amplifier Design Technique
Author :
Parvizi, Mahdi ; Allidina, Karim ; El-Gamal, Mourad N.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
This paper presents a design methodology for an ultra-low-power (ULP) and ultra-low-voltage (ULV) ultra-wideband (UWB) resistive-shunt feedback low-noise amplifier (LNA). The ULV circuit design challenges are discussed and a new biasing metric for ULV and ULP designs in deep-submicrometer CMOS technologies is introduced. Series inductive peaking in the feedback loop is analyzed and employed to enhance the bandwidth and noise performance of the LNA. Exploiting the new biasing metric, the design methodology, and series inductive peaking in the feedback loop, a 0.5 V, 0.75-mW broadband LNA with a current reuse scheme is implemented in a 90-nm CMOS technology. Measurement results show 12.6-dB voltage gain, 0.1-7-GHz bandwidth, 5.5-dB NF, -9-dBm IIP3, and -18-dB P1dB while occupying 0.23 mm2.
Keywords :
CMOS integrated circuits; UHF amplifiers; feedback amplifiers; low noise amplifiers; microwave amplifiers; ultra wideband technology; ULP resistive-shunt feedback LNA; ULV circuit design; ULV resistive-shunt feedback LNA; UWB resistive-shunt feedback LNA; bandwidth 0.1 GHz to 7 GHz; bandwidth performance enhancement; biasing metric; current reuse scheme; deep-submicrometer CMOS technology; feedback loop; gain 12.6 dB; noise performance enhancement; power 0.75 mW; series inductive peaking; size 90 nm; ultra low power resistive-shunt feedback low noise amplifier; ultra low voltage low noise amplifier design technique; ultra wideband low noise amplifier design technique; voltage 0.5 V; CMOS integrated circuits; MOSFET; Noise; Noise measurement; Current reuse; inductive series peaking; low-noise amplifier (LNA); resistive shunt feedback; ultra-low power (ULP); ultra-low voltage (ULV); ultra-wideband (UWB); ultra-wideband (UWB).;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2014.2334642