• DocumentCode
    1765095
  • Title

    A Highly Linear 1 GHz 1.3 dB NF CMOS Low-Noise Amplifier With Complementary Transconductance Linearization

  • Author

    Bum-Kyum Kim ; Donggu Im ; Jaeyoung Choi ; Kwyro Lee

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • Volume
    49
  • Issue
    6
  • fYear
    2014
  • fDate
    41791
  • Firstpage
    1286
  • Lastpage
    1302
  • Abstract
    A highly linear LNA is implemented in a 0.18 μm SOI CMOS process for 1 GHz SAW-less receiver applications. To achieve lower noise figure (NF) than conventional simultaneous noise and input matching methods, a capacitive loading based simultaneous noise and input matching technique reducing the NF degradation coming from a lossy gate inductor has been devised. In addition, in order to improve both the 1 dB gain compression point (CP1dB) and the third-order intercept point (IP3) without sacrificing NF, a large-signal transconductance linearization method adopting body-bias control and complementary-superposition is proposed. The proposed LNA shows a measured input-referred CP1dB of 3 dBm, 1 dB desensitization point (B1dB) of 0 dBm and IB (in-band)-IIP3 of 22 dBm with gain of 10.7 dB and NF of 1.3 dB at 1 GHz while driving a 50 Ω load impedance. It draws 20 mA with a buffer stage from a 2.5 V supply voltage.
  • Keywords
    CMOS analogue integrated circuits; UHF amplifiers; UHF integrated circuits; operational amplifiers; silicon-on-insulator; LNA; NF degradation; SAW-less receiver; SOI CMOS process; body-bias control; buffer stage; capacitive loading based simultaneous noise; complementary transconductance linearization; complementary-superposition; current 2.5 mA; current 20 mA; frequency 1 GHz; gain 1 dB; gain 10.7 dB; gain compression point; highly linear NF CMOS low-noise amplifier; input matching methods; large-signal transconductance linearization method; lossy gate inductor; noise figure; noise figure 1.3 dB; resistance 50 ohm; size 0.18 mum; third-order intercept point; Impedance; Impedance matching; Logic gates; Noise; Noise measurement; Transconductance; Transistors; Blocker; CMOS; MGTR; SAW-less; high linearity; intermodulation distortion; large signal; noise figure; noise matching; nonlinearity; simultaneous matching;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2014.2319262
  • Filename
    6809228