• DocumentCode
    1765129
  • Title

    An Improved Method For Retrieving Land Surface Albedo Over Rugged Terrain

  • Author

    Bo Gao ; Li Jia ; Menenti, Massimo

  • Author_Institution
    State Key Lab. of Remote Sensing Sci., Beijing Normal Univ., Beijing, China
  • Volume
    11
  • Issue
    2
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    554
  • Lastpage
    558
  • Abstract
    Land surface albedo is a very important parameter, which can be derived from a bidirectional reflectance distribution function (BRDF) model with angular integration of BRDF in a particular distribution of downward solar irradiance. The Algorithm for MODIS Bidirectional Reflectance Anisotropic of Land Surface (AMBRALS) utilizes a kernel-driven BRDF model to retrieve land surface albedo, but it does not take into account the topographic effect. This letter proposed an improved method by adding topographic factor to the AMBRALS, which removes the topographic effect on land surface reflectance and considers the topographic effect in retrieving land surface albedo. This method is applied to the HJ-1A/B CCD land surface reflectance data to retrieve the land surface albedo. The results are compared with those from the AMBRALS and with the ground measurements. The comparison results show that the proposed method performs well in general and better than the AMBRALS over rugged area.
  • Keywords
    digital elevation models; terrain mapping; AMBRALS; BRDF angular integration; HJ-1A-B CCD land surface reflectance data; bidirectional reflectance distribution function; land surface albedo; land surface reflectance; rugged terrain; solar irradiance distribution; topographic effect; topographic factor; Land surface; MODIS; Remote sensing; Scattering; Sea surface; Surface topography; Bidirectional reflectance distribution function (BRDF); HJ-1A/B; digital elevation model (DEM); land surface albedo; topographic effect;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2013.2275072
  • Filename
    6587522