Sharing Logic for Built-In Generationof Functional Broadside Tests

When built-in test generation is used for a design that can be partitioned into logic blocks, it is advantageous to identify groups of blocks whose tests have similar characteristics, and use the same built-in test generation logic for the blocks in each group. This paper studies this issue for a built-in test generation method that produces functional broadside tests. Functional broadside tests are important for addressing overtesting of delay faults as well as avoiding excessive power dissipation during test application. The paper discusses the design of the test generation logic for a group of logic blocks, and the selection of the groups.