Title :
An InGaAlAs–InGaAs Two-Color Photodetector for Ratio Thermometry
Author :
Xinxin Zhou ; Hobbs, Matthew J. ; White, Benjamin S. ; David, J.P.R. ; Willmott, Jon R. ; Chee Hing Tan
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Abstract :
We report the evaluation of a molecular-beam epitaxy grown two-color photodetector for radiation thermometry. This two-color photodetector consists of two p+in+ diodes, an In0.53Ga0.25Al0.22As (hereafter InGaAlAs) p+in+ diode, which has a cutoff wavelength of 1180 nm, and an In0.53Ga0.47As (hereafter InGaAs) p+in+ diode with a cutoff wavelength of 1700 nm. Our simple monolithic integrated two-color photodetector achieved comparable output signal and signal-to-noise (SNR) ratio to that of a commercial two-color Si-InGaAs photodetector. The InGaAlAs and InGaAs diodes detect blackbody temperature as low as 275°C and 125°C, respectively, with an SNR above 10. The temperature errors extracted from our data are 4°C at 275°C for the InGaAlAs diode and 2.3°C at 125°C for the InGaAs diode. As a ratio thermometer, our two-color photodetector achieves a temperature error of 12.8°C at 275°C, but this improves with temperature to 0.1°C at 450°C. These results demonstrated the potential of InGaAlAs-InGaAs two-color photodetector for the development of high performance two-color array detectors for radiation thermometry and thermal imaging of hot objects.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; gallium compounds; indium compounds; infrared imaging; p-i-n photodiodes; photodetectors; temperature measurement; In0.53Ga0.25Al0.22As-In0.53Ga0.47As; molecular-beam epitaxy; monolithic integrated two-color photodetector; pin diodes; radiation thermometry; signal-to-noise ratio; temperature errors; thermal imaging; Indium gallium arsenide; Photodetectors; Signal to noise ratio; Silicon; Temperature measurement; Wavelength measurement; Radiation thermometry; temperature measurement; two-color photodetector;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2013.2297409