Title :
Process-Resilient Low-Jitter All-Digital PLL via Smooth Code-Jumping
Author :
Pei-Ying Chao ; Chao-Wen Tzeng ; Shi-Yu Huang ; Chia-Chieh Weng ; Shan-Chien Fang
Author_Institution :
Electr. Eng. Dept., Nat. TsingHua Univ., Hsinchu, Taiwan
Abstract :
For an all-digital phase-locked loop, the frequency range supported is often segmented, and this could cause significant jitter when the operating condition (such as the supply voltage and/or the temperature) changes. To address this issue, we present a scheme, called smooth code-jumping, that can stitch together the segmented frequency profile of a digitally controlled oscillator (DCO) into a continuous range, and thereby reduce the jitter significantly. This scheme incorporates a new mirror-DCO-based calibration scheme to take into account process variations. We validate this scheme by test chips in 0.18-μm CMOS technology. Measurement results show that, when operating at 1 GHz, the rms jitter is 4.3 ps (0.43%UI) and the peak-to-peak jitter is 35.6 ps (3.56%UI), respectively.
Keywords :
CMOS integrated circuits; calibration; jitter; oscillators; phase locked loops; CMOS technology; account process variations; all-digital phase-locked loop; digitally controlled oscillator; frequency 1 GHz; frequency range; mirror-DCO-based calibration scheme; operating condition; peak-to-peak jitter; process-resilient low-jitter all-digital PLL; segmented frequency profile; size 0.18 mum; smooth code-jumping; supply voltage; Calibration; Clocks; Delay; Jitter; Mirrors; Phase locked loops; Tuning; All-digital phase-locked loop (ADPLL); digitally controlled oscillator (DCO); smooth code-jumping;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2230454