Title :
Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects
Author :
Reed, R.A. ; Weller, Robert A. ; Akkerman, A. ; Barak, Joseph ; Culpepper, W. ; Duzellier, S. ; Foster, C. ; Gaillardin, M. ; Hubert, Guillaume ; Jordan, T. ; Jun, I. ; Koontz, S. ; Lei, Fan ; McNulty, P. ; Mendenhall, Marcus H. ; Murat, M. ; Nieminen, Pe
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
This anthology contains contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The topics span from basic mechanisms for single-particle induced failures to applied tasks like developing websites to predict on-orbit single event failure rates using Monte Carlo radiation transport tools.
Keywords :
Monte Carlo methods; radiation effects; Monte Carlo-based radiation transport tools; on-orbit single event failure rates; semiconductor material; single event effects; single particle event; single-particle induced failures; Ions; Kinetic energy; Mesons; Monte Carlo methods; Neutrons; Protons; Silicon; Monte Carlo radiation transport; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2262101
