• DocumentCode
    1765871
  • Title

    Investigation on Performance Decay on Photovoltaic Modules: Snail Trails and Cell Microcracks

  • Author

    Dolara, Alberto ; Leva, S. ; Manzolini, Giampaolo ; Ogliari, E.

  • Author_Institution
    Dept. of Energy, Politec. di Milano, Milan, Italy
  • Volume
    4
  • Issue
    5
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    1204
  • Lastpage
    1211
  • Abstract
    Over the past few decades, the snail trail phenomenon has been known as a discoloration defect on photovoltaic (PV) modules. More recently, snail trails have also been correlated with cell microcracks in PV modules. Despite a serious concern about effects of this phenomenon on PV module performances, very few publications have dealt with this subject. The main purpose of this study is to compare the performances of polycrystalline silicon PV modules affected by the snail trail phenomenon with the reference module. The comparison was performed focusing on I-V and P-V characteristics, thermography analysis, and energy production. Measurements were carried out at the SolarTech Lab of Politecnico di Milano, Italy. The obtained results show that the snail trails may affect the polycrystalline silicon PV modules performances: Compared with reference PV, the maximum power production at standard conditions is reduced by about 40%. The energy production measured over 30 days was about 25% lower than expected.
  • Keywords
    infrared imaging; microcracks; solar cells; I-V characteristics; P-V characteristics; cell microcracks; discoloration defect; energy production; performance decay investigation; photovoltaic modules; polycrystalline silicon PV; snail trails; thermography analysis; Current measurement; Energy measurement; Photovoltaic systems; Standards; Temperature measurement; Voltage measurement; Final yield; PV system reliability; microcracks; photovoltaic (PV) modules; snail trail phenomena;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2014.2330495
  • Filename
    6861441