Title :
Large-Signal Measurements and Nonlinear Characterization of an Analog Frontend for Passive UHF CMOS RFID Transponders
Author :
Essel, Jochen ; Brenk, Daniel ; Heidrich, Juergen ; Weigel, Robert ; Kissinger, Dietmar
Author_Institution :
Infineon Technol., Munich, Germany
Abstract :
This work focuses on the comprehensive measurement-based nonlinear characterization of an integrated analog frontend, which is implemented into a passive multifunctional radio-frequency-identification (RFID) transponder. It explains the necessity and the practical execution of large-signal characterization and nonlinear analyses of the frontend at ultra-high-frequencies. The fundamentals of the implemented source-pull measurement setup are described in detail and the results of selected measurements are presented. To the authors knowledge, this is the first time that a passive RFID frontend is characterized by nonlinear large-signal measurements.
Keywords :
CMOS integrated circuits; radiofrequency identification; transponders; analog frontend; nonlinear characterization; nonlinear large-signal measurements; passive UHF CMOS RFID transponders; passive multifunctional radio-frequency-identification transponder; Calibration; Frequency measurement; Harmonic analysis; Impedance; Impedance measurement; Tuners; UHF measurements; Analog frontend; large-signal measurement; nonlinear; radio-frequency-identification (RFID); source-pull; ultra-high-frequencies (UHF);
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2012.2231422