Title :
A 35-
Pitch IR Thermo-Mechanical MEMS Sensor With AC-Coupled Optical Readout
Author :
Adiyan, Ulas ; Civitci, Fehmi ; Ferhanoglu, Onur ; Torun, Hamdi ; Urey, Hakan
Author_Institution :
Electr. & Electron. Eng. Dept., Koc Univ., İstanbul, Turkey
Abstract :
A thermo-mechanical MEMS detector with 35-μm pixel pitch is designed, fabricated, and characterized. This fabricated design has one of the smallest pixel sizes among the IR thermo-mechanical MEMS sensors in the literature. The working principle of the MEMS detector is based on the bimaterial effect that creates a deflection when exposed to IR radiation in the 8-12-μm waveband. The nanometer level out of plane mechanical motion is observed in response to IR heating of the pixel, which is detected by a diffraction grating-based optical readout. Performance of MEMS sensor arrays with optical readout have been limited by a large DC bias that accompanies a small AC signal. We developed a novel optical setup to reduce the DC term and the related noise using an AC-coupled detection scheme. Detailed noise characterization of the pixel and the readout system is reported in this paper. The noise equivalent temperature difference of our detector is measured as 216 mK using f/0.86 lens with the AC-coupled optical readout. Finally, we obtained a thermal image using a single MEMS pixel combined with a scanning configuration. Despite the reduced pixel size, the measured noise levels are comparable to the state-of-the-art thermo-mechanical IR sensors.
Keywords :
diffraction gratings; electric current measurement; electric noise measurement; electric sensing devices; image scanners; image sensors; infrared detectors; infrared imaging; microfabrication; microsensors; optical sensors; readout electronics; sensor arrays; temperature measurement; temperature sensors; AC-coupled detection scheme; AC-coupled optical readout; IR heating; IR radiation; IR thermomechanical MEMS sensor; bimaterial effect; diffraction grating-based optical readout; image scanning configuration; microfabrication; noise equivalent temperature difference; noise level measurement; pixel size reduction; plane mechanical motion; single MEMS pixel; temperature 216 mK; thermal imaging; wavelength 35 mum; wavelength 8 mum to 12 mum; Detectors; Micromechanical devices; Noise; Optical device fabrication; Optical imaging; Optical sensors; Thermomechanical processes; Diffraction Grating; IR Imaging; IR imaging; Optical Readout; Thermo-Mechanical MEMS; Thermo-mechanical MEMS; diffraction grating; optical readout;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2014.2384503