DocumentCode :
1766473
Title :
A Silicon Biristor With Reduced Operating Voltage: Proposal and Analysis
Author :
Kumar, Mamidala Jagadesh ; Maheedhar, M. ; Varma, P.P.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Delhi, New Delhi, India
Volume :
3
Issue :
2
fYear :
2015
fDate :
42064
Firstpage :
67
Lastpage :
72
Abstract :
In this paper, using 2-D simulations, we report a silicon biristor with reduced operating voltage using the surface accumulation layer transistor (SALTran) concept. The electrical characteristics of the proposed SALTran biristor are simulated and compared with that of a conventional silicon biristor with identical dimensions. The proposed device is optimized with respect to the device parameters to ensure a reasonable latch window while maintaining low latch voltages. Our results demonstrate that the SALTran biristor exhibits a latch-up voltage of 2.14 V and a latch-down voltage of 1.68 V leading to a 57% lower operating voltage compared to the conventional silicon biristor.
Keywords :
bipolar transistors; resistors; silicon; 2-D simulation; SALTran biristor; bipolar junction transistor; bistable resistor; electrical characteristic; latch window; latch-down voltage; latch-up voltage; reduced operating voltage; silicon biristor; surface accumulation layer transistor; voltage 1.68 V; voltage 2.14 V; Bipolar transistors; Doping; Impact ionization; Latches; Semiconductor process modeling; Silicon; Transistors; Biristor; SALTran effect; bistable resistor; current gain; device optimization; open-base breakdown; surface accumulation layer transistor (SALTran) effect;
fLanguage :
English
Journal_Title :
Electron Devices Society, IEEE Journal of the
Publisher :
ieee
ISSN :
2168-6734
Type :
jour
DOI :
10.1109/JEDS.2014.2384518
Filename :
6994257
Link To Document :
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