Title :
Partial discharge pulses at artificial protrusions in SF6 under negative IEC60060-3 standard impulses
Author :
Ming Ren ; Ming Dong ; Zhigang Xiao ; Aici Qiu
Author_Institution :
State Key Lab. of Electr. Insulation for Power Equip., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
Protrusion defects on conductor in gas insulated switchgear (GIS) formed by manufacture, transportation, installation or operation can seriously degrade the withstand voltage strength. Partial discharge (PD) test under ac voltage is sometimes ineffective for this type of defect in practice. Thus, we carried out PD measurements for protrusion defects under four types of standard impulse voltages and explored some basic behaviors and characteristics of PDs, which could provide some guidance on impulse PD test which may be used as a more stringent measure in the future field test. In this paper, PD pulses at protrusions with tip radii of 25, 100 and 500 μm in SF6 in gas pressure from 0.05 MPa to 0.55 MPa, were detected under four negative IEC60060-3 impulses by using a specially designed measuring system. The voltage-time lag characteristics of the first discharge under the impulses are investigated and described by the proposed theoretical "voltage-time lag (V-t) curve of the first discharge", and the simulated results were compared with the experimentally measured V-t points. Seven different discharge current and light pulse sequences were distinguished and analyzed statistically. And then, the occurrences and mechanisms underlying these different sequences were discussed in detail.
Keywords :
IEC standards; fault diagnosis; gas insulated switchgear; partial discharge measurement; GIS; PD measurements; artificial protrusions; discharge current sequences; fault diagnosis; gas insulated switchgear; light pulse sequences; negative IEC60060-3 standard impulses; partial discharge pulses; partial discharge test; pressure 0.05 MPa to 0.55 MPa; protrusion defects; voltage-time lag curve; withstand voltage strength; Discharges (electric); Electric fields; Partial discharges; Silicon; Sulfur hexafluoride; Voltage measurement; Partial discharges; fault diagnosis; field test; gas insulatedswitchgear; impulse voltage; protrusion defects;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2013.004058