DocumentCode :
1766634
Title :
A 1.3–2.4-GHz 3.1-mW VCO Using Electro-Thermo- Mechanically Tunable Self-Assembled MEMS Inductor on HR Substrate
Author :
Bhattacharya, A. ; Mandal, D. ; Bhattacharyya, T.K.
Author_Institution :
Adv. Technol. Dev. Centre, IIT Kharagpur, Kharagpur, India
Volume :
63
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
459
Lastpage :
469
Abstract :
This paper reports implementation and wafer-level testing of a self-assembled tunable microelectromechanical systems (MEMS) inductor with electrostatic, electrothermal, and thermal tuning capability. The surface micromachined inductor was fabricated on a high-resistivity (HR) substrate ( ρ = 5 kΩ·cm) using a doped polysilicon and Au-Cr metal combination as a bimorph structural layer for providing self-assembled elevation with an enhanced Q factor. Extensive electro-thermo-mechanical and RF characterization was carried out for the inductor, the latter over a temperature range from -30 °C to 150 °C. Furthermore, the tunable inductor was integrated in the tank circuit of a CMOS oscillator and wafer-level MEMS-CMOS voltage-controlled oscillator testing revealed a best figure-of-merit of -197.6 dB with a frequency tuning range of 1.3-2.4 GHz with a power consumption of 3.07 mW.
Keywords :
CMOS integrated circuits; MMIC oscillators; Q-factor; chromium; circuit tuning; electron device testing; field effect MMIC; gold; inductors; micromechanical devices; silicon; voltage-controlled oscillators; Au-Cr; Au-Cr metal; CMOS oscillator; RF characterization; Si; VCO; bimorph structural layer; doped polysilicon; electro-thermo-mechanically tunable self-assembled MEMS inductor; electrostatic tuning capability; electrothermal tuning capability; enhanced Q-factor; frequency 1.3 GHz to 2.4 GHz; high-resistivity substrate; power 3.1 mW; power consumption; surface micromachined inductor; tank circuit; temperature -30 degC to 150 degC; thermal tuning capability; wafer-level testing; Inductors; Metals; Micromechanical devices; Radio frequency; Residual stresses; Substrates; Voltage-controlled oscillators; Bond wire; high-resistivity (HR) substrate; microelectromechanical systems (MEMS) inductor; quality factor; self-assembly; voltage-controlled oscillator (VCO);
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2014.2380357
Filename :
6994277
Link To Document :
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