DocumentCode :
1766730
Title :
Electron Transport Models and Precision Measurements With the Constant Voltage Conductivity Method
Author :
Dekany, Justin ; Dennison, J.R. ; Sim, Alec M. ; Brunson, Jerilyn
Author_Institution :
Phys. Dept., Utah State Univ., Logan, UT, USA
Volume :
41
Issue :
12
fYear :
2013
fDate :
Dec. 2013
Firstpage :
3565
Lastpage :
3576
Abstract :
Recent advances are described in the techniques, resolution, and sensitivity of the constant voltage conductivity (CVC) method and the understanding of the role of charge injection mechanisms and the evolution of internal charge distributions in associated charge transport theories. These warrant reconsideration of the appropriate range of applicability of this test method to spacecraft charging. We conclude that under many (but not all) common spacecraft charging scenarios, careful CVC tests provide appropriate evaluation of conductivities down to ≈ 10-22 (Ωcm)-1, corresponding to decay times of many years. We describe substantial upgrades to an existing CVC chamber, which improved the precision of conductivity measurements by more than an order of magnitude. At room temperature and above and at higher applied voltages, the ultimate instrument conductivity resolution can increase to ≈ 4·10-22 (Ωcm)-1, corresponding to decay times of more than a decade. Measurements of the transient conductivity of low-density polyethylene using the CVC method are fit very well by a dynamic model for the conductivity in highly disordered insulating materials over more than eight orders of magnitude in current and more than six orders of magnitude in time. Current resolution of the CVC system approaches fundamental limits in the laboratory environment set by the Johnson thermal noise of the sample resistance and the radiation-induced conductivity from the natural terrestrial background radiation dose from the cosmic ray background.
Keywords :
charge exchange; charge injection; cosmic background radiation; electron transport theory; polyethylene insulation; spacecraft charging; thermal conductivity measurement; thermal noise; transients; CVC method; Johnson thermal noise; charge distribution; charge injection mechanism; charge transport theory; conductivity resolution; constant voltage conductivity method; cosmic ray background; decay time; dynamic model; electron transport model; fundamental limit; insulating material; laboratory environment; low density polyethylene; natural terrestrial background radiation dose; precision measurement; radiation induced conductivity; sample resistance; spacecraft charging; transient conductivity measurement; Conductivity; Conductivity measurement; Current measurement; Instruments; Materials; Temperature measurement; Voltage measurement; Charge storage; conductivity; dielectric materials; electron transport; instrumentation; insulator;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2013.2288366
Filename :
6671476
Link To Document :
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