DocumentCode :
1766890
Title :
Novel D-band Si-based integrated platform for millimeter wave
Author :
Basha, M.A. ; Samir, A. ; Naeini, S. Safavi ; Biglarbegian, B. ; Gigoyan, S.
Author_Institution :
Center for Nanotechnol., Zewail City of Sci. & Technol., Giza, Egypt
fYear :
2014
fDate :
6-9 Oct. 2014
Firstpage :
1068
Lastpage :
1071
Abstract :
A low-cost and low-loss Silicon-on-Insulator (SOI) integrated platform is proposed for millimeter-wave (mm-wave) applications. The proposed platform supports mm-wave components in the D-band using dielectric image guide structure. The SOI mm-wave integrated platform uses high resistivity Silicon wafers for very low-loss in the D-Band. All passive components can be fabricated on the same platform with high potential of integration of active devices. There is no need for post-fabrication assembly steps for complex systems, which will provide high accuracy of placement of different components on the same platform. The platform is theoretically and experimentally investigated. The fabrication process is a simple one-mask fabrication process composed of deep reactive ion etching of the device layer of the SOI wafer. Design of dielectric image guide in the D-Band is performed. The simulation results show attenuation better than 0.25 dB/cm. Fabrication and experimental measurements are performed at 60 and 100 GHz.
Keywords :
masks; millimetre wave devices; silicon-on-insulator; sputter etching; D-band Si-based integrated platform; SOI; Si; complex systems; deep reactive ion etching; dielectric image guide structure; frequency 100 GHz; frequency 60 GHz; millimeter-wave components; passive components; silicon wafers; silicon-on-insulator; simple one-mask fabrication; Conductivity; Dielectrics; Electromagnetic waveguides; Fabrication; Millimeter wave technology; Silicon; Silicon-on-insulator; D-band; Dielectric Image Guide; SOI; micromachining; millimeter wave;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference (EuMC), 2014 44th European
Conference_Location :
Rome
Type :
conf
DOI :
10.1109/EuMC.2014.6986623
Filename :
6986623
Link To Document :
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